Used HP 4145B

Manufacturer:HP

Refurbished by:Allwin21 Corp

Designed for production-line and laboratory use, the HP4145B is the electronics industry's first standalone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage-and current-sensitive devices, measures the resulting current and voltage responses, and displays the results in a user-selectable format (graph, list, matrix, or schmoo) on a built-in CRT display. An on-board programmable calculator provides real-time calculation of voltage/current-dependent parameters, such as the current gain (HFE) and transconductance(gm) of transistors, which can also be displayed on the CRT. A number of powerful graphic analysis tools--marker, cursor, line function, and interpolation--enhance the HP 4145B's basic capabilities and provide fast, accurate analysis of semiconductor devices, leading to increased production yields and improved device quality.

Four built-in source monitor units (SMUs) are the heart of the HP 4145B. Each SMU can be independently programmed to function as either a voltage source/current monitor or a current source/voltage monitor. Thus a bipolar transistor, for example, can be completely characterized in common-base, common-emitter, and common-collector configurations without changing connectionsoonly changing the SMU’s operating modes is required. The HP 4145B is also equipped with 2 voltage sources and 2 voltage monitors for measurements on devices having more than 4 terminals, such as ICs. The HP4145B can be controlled from the front panel via the HP-IB (standard), or by measurement setups stored on diskettes.

Displayed information--measurement setups, auto-sequence programs, and measurement results can be dumped directly onto an external graphics plotter to obtain publication quality hard copies. A built-in 3”inch disk drive enables you to store measurement setups and measured data, which can be accessed by another compatible HP disk drive for further processing.

HP4145B Parameter Analyzer key features:

• Fully automatic, high-peed dc characterization of semiconductor devices
• High-resolution, wide-range sourcing and measurement
• I: 50 fA to 100 mA; V: 1 mV to 100 V
• Maximum 1140 measurement and display points for precise measurement and analysis
• Flexible graphic analysis functions for quick parameter extraction
• Built-in 3-inch disk drive for storage of 240 user programs or 105 measurement results

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